So, I'm trying to model a probability problem from a text I'm reading:
Consider an experiment that consists of testing two integrated circuits (IC chips) that come from the same silicon wafer and observing in each case whether a chip is accepted (a) or rejected (r). The sample space of the experiment is S = {rr, ra, ar, aa}. Let B denote the event that the first chip tested is rejected. Mathematically, B = {rr, ra}. Similarly, let A = {rr, ar} denote the event that the second chip is a failure.
Consider an experiment that consists of testing two integrated circuits (IC chips) that come from the same silicon wafer and observing in each case whether a chip is accepted (a) or rejected (r). The sample space of the experiment is S = {rr, ra, ar, aa}. Let B denote the event that the first chip tested is rejected. Mathematically, B = {rr, ra}. Similarly, let A = {rr, ar} denote the event that the second chip is a failure.