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6:50 PM
So, I'm trying to model a probability problem from a text I'm reading:

Consider an experiment that consists of testing two integrated circuits (IC chips) that come from the same silicon wafer and observing in each case whether a chip is accepted (a) or rejected (r). The sample space of the experiment is S = {rr, ra, ar, aa}. Let B denote the event that the first chip tested is rejected. Mathematically, B = {rr, ra}. Similarly, let A = {rr, ar} denote the event that the second chip is a failure.
and what I have so far is:

Probability[rr + ar \[Conditioned] rr + ra,
 {rr \[Distributed] BernoulliDistribution[0.01],
  ra \[Distributed] BernoulliDistribution[0.01],
  ar \[Distributed] BernoulliDistribution[0.01],
  aa \[Distributed] BernoulliDistribution[0.97]}]
but I'm getting conditions:

0.5            !2
0.507487   True
and am completely at a loss as to what Assumptions I might be able to add to the Probability call to handle it.
 

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